{"title":"超级电容器频率相关失效区域定义","authors":"M. Catelani, L. Ciani, M. Marracci, B. Tellini","doi":"10.1109/I2MTC.2014.6860897","DOIUrl":null,"url":null,"abstract":"In this paper a new proposal of failure zone definition for ultracapacitors is discussed. Such regions of failure are suitably defined in the frequency domain. The ultracapacitor behavior and its possible ageing are characterized via an impedance spectroscopy measurement technique. Results of an experimental analysis are reported, and an investigation of the possible performance degradation as well as of the ultracapacitor lifetime reduction is carried out and discussed in comparison with the common industry approach of failure definition.","PeriodicalId":331484,"journal":{"name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"634 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Frequency dependent failure region definition for supercapacitors\",\"authors\":\"M. Catelani, L. Ciani, M. Marracci, B. Tellini\",\"doi\":\"10.1109/I2MTC.2014.6860897\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a new proposal of failure zone definition for ultracapacitors is discussed. Such regions of failure are suitably defined in the frequency domain. The ultracapacitor behavior and its possible ageing are characterized via an impedance spectroscopy measurement technique. Results of an experimental analysis are reported, and an investigation of the possible performance degradation as well as of the ultracapacitor lifetime reduction is carried out and discussed in comparison with the common industry approach of failure definition.\",\"PeriodicalId\":331484,\"journal\":{\"name\":\"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings\",\"volume\":\"634 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/I2MTC.2014.6860897\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC.2014.6860897","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Frequency dependent failure region definition for supercapacitors
In this paper a new proposal of failure zone definition for ultracapacitors is discussed. Such regions of failure are suitably defined in the frequency domain. The ultracapacitor behavior and its possible ageing are characterized via an impedance spectroscopy measurement technique. Results of an experimental analysis are reported, and an investigation of the possible performance degradation as well as of the ultracapacitor lifetime reduction is carried out and discussed in comparison with the common industry approach of failure definition.