{"title":"电子粉末衍射","authors":"J. Zuo, J. Lábár, J. Zhang, T. Gorelik, U. Kolb","doi":"10.1107/97809553602060000939","DOIUrl":null,"url":null,"abstract":"Electron powder diffraction patterns can be recorded from small volumes of nanoparticles or localized areas of nanocrystalline thin films, which makes electron diffraction a complementary technique to X-ray and neutron powder diffraction for challenging samples. This chapter covers electron diffraction techniques for powder diffraction data collection and analysis, including electron-probe formation, background treatment and reduction of diffraction data to pair distribution functions.","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"134 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Electron powder diffraction\",\"authors\":\"J. Zuo, J. Lábár, J. Zhang, T. Gorelik, U. Kolb\",\"doi\":\"10.1107/97809553602060000939\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electron powder diffraction patterns can be recorded from small volumes of nanoparticles or localized areas of nanocrystalline thin films, which makes electron diffraction a complementary technique to X-ray and neutron powder diffraction for challenging samples. This chapter covers electron diffraction techniques for powder diffraction data collection and analysis, including electron-probe formation, background treatment and reduction of diffraction data to pair distribution functions.\",\"PeriodicalId\":338076,\"journal\":{\"name\":\"International Tables for Crystallography\",\"volume\":\"134 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Tables for Crystallography\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1107/97809553602060000939\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Tables for Crystallography","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1107/97809553602060000939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electron powder diffraction patterns can be recorded from small volumes of nanoparticles or localized areas of nanocrystalline thin films, which makes electron diffraction a complementary technique to X-ray and neutron powder diffraction for challenging samples. This chapter covers electron diffraction techniques for powder diffraction data collection and analysis, including electron-probe formation, background treatment and reduction of diffraction data to pair distribution functions.