{"title":"调制散射快速近场探测中的误差分析","authors":"J. Bolomey, D. Picard","doi":"10.1109/EUMA.1983.333202","DOIUrl":null,"url":null,"abstract":"This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Error Analysis in Fast Near Field Probing by the Modulated Scattering Technique\",\"authors\":\"J. Bolomey, D. Picard\",\"doi\":\"10.1109/EUMA.1983.333202\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.\",\"PeriodicalId\":105436,\"journal\":{\"name\":\"1983 13th European Microwave Conference\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1983 13th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1983.333202\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error Analysis in Fast Near Field Probing by the Modulated Scattering Technique
This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.
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