H. Debéda, I. Favre, A. Gracia, N. Labat, B. Plano, H. Frémont
{"title":"为期一周的Euro-dots课程:微电子组件:从封装到可靠性","authors":"H. Debéda, I. Favre, A. Gracia, N. Labat, B. Plano, H. Frémont","doi":"10.1109/EAEEIE.2013.6576514","DOIUrl":null,"url":null,"abstract":"The course “Microelectronic assemblies: from packaging to reliability” is a one-week-course module within the Euro-dots program proposed at the IMS Laboratory, University Bordeaux, with lectures illustrated by labs. It takes benefits from expertise of different teachers and research teams and also technological, failure analysis and characterization platforms.","PeriodicalId":326600,"journal":{"name":"2013 24th EAEEIE Annual Conference (EAEEIE 2013)","volume":"216 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A one week-lecture in the Euro-dots course program: Microelectronic assemblies: From packaging to reliability\",\"authors\":\"H. Debéda, I. Favre, A. Gracia, N. Labat, B. Plano, H. Frémont\",\"doi\":\"10.1109/EAEEIE.2013.6576514\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The course “Microelectronic assemblies: from packaging to reliability” is a one-week-course module within the Euro-dots program proposed at the IMS Laboratory, University Bordeaux, with lectures illustrated by labs. It takes benefits from expertise of different teachers and research teams and also technological, failure analysis and characterization platforms.\",\"PeriodicalId\":326600,\"journal\":{\"name\":\"2013 24th EAEEIE Annual Conference (EAEEIE 2013)\",\"volume\":\"216 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 24th EAEEIE Annual Conference (EAEEIE 2013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EAEEIE.2013.6576514\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 24th EAEEIE Annual Conference (EAEEIE 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EAEEIE.2013.6576514","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A one week-lecture in the Euro-dots course program: Microelectronic assemblies: From packaging to reliability
The course “Microelectronic assemblies: from packaging to reliability” is a one-week-course module within the Euro-dots program proposed at the IMS Laboratory, University Bordeaux, with lectures illustrated by labs. It takes benefits from expertise of different teachers and research teams and also technological, failure analysis and characterization platforms.