{"title":"供电网络干扰影响下电子设备电磁兼容性建模","authors":"Z. Gizatullin, M. Nuriev","doi":"10.1109/ICIEAM54945.2022.9787186","DOIUrl":null,"url":null,"abstract":"A frequent cause of violation of the noise immunity of modern electronic means are microsecond, nanosecond impulse interferences on the power supply network or dynamic voltage changes. These tasks are especially relevant for the elements of control systems of energy facilities. The paper considers the types of interference in the power supply network of electronic means. An analysis of the propagation of impulse noise has been carried out. Models have been developed and an analysis of the functioning of digital elements under the influence of interference through the power supply port has been carried out. The typical areas of functioning of electronic means are singled out depending on the amplitude and duration of interference in the power supply network. Methods for increasing the noise immunity of electronic means under the influence of interference through the power supply are considered.","PeriodicalId":128083,"journal":{"name":"2022 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Modeling the Electromagnetic Compatibility of Electronic Means under the Influence of Interference Through the Power Supply Network\",\"authors\":\"Z. Gizatullin, M. Nuriev\",\"doi\":\"10.1109/ICIEAM54945.2022.9787186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A frequent cause of violation of the noise immunity of modern electronic means are microsecond, nanosecond impulse interferences on the power supply network or dynamic voltage changes. These tasks are especially relevant for the elements of control systems of energy facilities. The paper considers the types of interference in the power supply network of electronic means. An analysis of the propagation of impulse noise has been carried out. Models have been developed and an analysis of the functioning of digital elements under the influence of interference through the power supply port has been carried out. The typical areas of functioning of electronic means are singled out depending on the amplitude and duration of interference in the power supply network. Methods for increasing the noise immunity of electronic means under the influence of interference through the power supply are considered.\",\"PeriodicalId\":128083,\"journal\":{\"name\":\"2022 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIEAM54945.2022.9787186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIEAM54945.2022.9787186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling the Electromagnetic Compatibility of Electronic Means under the Influence of Interference Through the Power Supply Network
A frequent cause of violation of the noise immunity of modern electronic means are microsecond, nanosecond impulse interferences on the power supply network or dynamic voltage changes. These tasks are especially relevant for the elements of control systems of energy facilities. The paper considers the types of interference in the power supply network of electronic means. An analysis of the propagation of impulse noise has been carried out. Models have been developed and an analysis of the functioning of digital elements under the influence of interference through the power supply port has been carried out. The typical areas of functioning of electronic means are singled out depending on the amplitude and duration of interference in the power supply network. Methods for increasing the noise immunity of electronic means under the influence of interference through the power supply are considered.