用不可靠的组件构建可靠的存储器的极限

L. Varshney
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引用次数: 8

摘要

长期以来,人们一直对在电路复杂性限制下,用不可靠的元件(如噪声位单元和噪声逻辑门)构建可靠的存储系统感兴趣。以前的工作只关注建设性的可实现性结果,但在这里,我们首次为这个问题开发了逆定理。基本技术依赖于熵产生/耗散参数,并平衡了耗散熵与所使用代码冗余的需求。通过球体填充论证,利用了噪声逻辑门的熵耗散能力的一个界。尽管本文所述的可实现性结果与相反的结果之间仍有很大差距,但本文提供了一些在这第一步之后继续前进的建议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Toward limits of constructing reliable memories from unreliable components
There has been long-standing interest in constructing reliable memory systems from unreliable components like noisy bit-cells and noisy logic gates, under circuit complexity constraints. Prior work has focused exclusively on constructive achievability results, but here we develop converse theorems for this problem for the first time. The basic technique relies on entropy production/dissipation arguments and balances the need to dissipate entropy with the redundancy of the code employed. A bound from the entropy dissipation capability of noisy logic gates is used via a sphere-packing argument. Although a large gap remains between refined achievability results stated herein and the converse, some suggestions for ways to move forward beyond this first step are provided.
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