{"title":"用扫描光电流显微镜研究碳纳米管晶体管的接触特性","authors":"Jaeku Park, Y. H. Ann, Jiwoong Park","doi":"10.1109/CLEOPR.2007.4391716","DOIUrl":null,"url":null,"abstract":"Scanning photocurrent measurements are demonstrated in individual carbon nanotube field- effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.","PeriodicalId":384775,"journal":{"name":"2007 Conference on Lasers and Electro-Optics - Pacific Rim","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of Contact Properties in Carbon Nanotube Transistors Using Scanning Photocurrent Microscopy\",\"authors\":\"Jaeku Park, Y. H. Ann, Jiwoong Park\",\"doi\":\"10.1109/CLEOPR.2007.4391716\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scanning photocurrent measurements are demonstrated in individual carbon nanotube field- effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.\",\"PeriodicalId\":384775,\"journal\":{\"name\":\"2007 Conference on Lasers and Electro-Optics - Pacific Rim\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-12-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Conference on Lasers and Electro-Optics - Pacific Rim\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CLEOPR.2007.4391716\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Conference on Lasers and Electro-Optics - Pacific Rim","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CLEOPR.2007.4391716","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of Contact Properties in Carbon Nanotube Transistors Using Scanning Photocurrent Microscopy
Scanning photocurrent measurements are demonstrated in individual carbon nanotube field- effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.
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