{"title":"670 GHz源的相位噪声测量","authors":"J. A. Desalvo, A. Hati, C. Nelson, D. Howe","doi":"10.1109/FCS.2012.6243679","DOIUrl":null,"url":null,"abstract":"We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.","PeriodicalId":256670,"journal":{"name":"2012 IEEE International Frequency Control Symposium Proceedings","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Phase-noise measurement of a 670 GHz source\",\"authors\":\"J. A. Desalvo, A. Hati, C. Nelson, D. Howe\",\"doi\":\"10.1109/FCS.2012.6243679\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.\",\"PeriodicalId\":256670,\"journal\":{\"name\":\"2012 IEEE International Frequency Control Symposium Proceedings\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Frequency Control Symposium Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FCS.2012.6243679\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Frequency Control Symposium Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FCS.2012.6243679","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
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