{"title":"高速并行输入输出位片容错卷积器","authors":"L. Dadda, M. Sami","doi":"10.1109/DFTVS.1992.224346","DOIUrl":null,"url":null,"abstract":"A family of convolvers for high sample rate is proposed, based on the composition of subconvolvers characterized by one bit samples and by modular, regular structures decomposable in identical bit-slices. Samples are represented in parallel or in skew form and the whole circuit is a sequential circuit whose combinatorial part is an array of full adders, assuring a high sampling rate. Fault tolerance provisions are also discussed.<<ETX>>","PeriodicalId":319218,"journal":{"name":"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"High-speed parallel input-output bit-sliced fault-tolerant convolvers\",\"authors\":\"L. Dadda, M. Sami\",\"doi\":\"10.1109/DFTVS.1992.224346\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A family of convolvers for high sample rate is proposed, based on the composition of subconvolvers characterized by one bit samples and by modular, regular structures decomposable in identical bit-slices. Samples are represented in parallel or in skew form and the whole circuit is a sequential circuit whose combinatorial part is an array of full adders, assuring a high sampling rate. Fault tolerance provisions are also discussed.<<ETX>>\",\"PeriodicalId\":319218,\"journal\":{\"name\":\"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1992.224346\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1992.224346","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A family of convolvers for high sample rate is proposed, based on the composition of subconvolvers characterized by one bit samples and by modular, regular structures decomposable in identical bit-slices. Samples are represented in parallel or in skew form and the whole circuit is a sequential circuit whose combinatorial part is an array of full adders, assuring a high sampling rate. Fault tolerance provisions are also discussed.<>