纳米管/纳米线晶体管TEM检测与电学表征的相关性研究

{"title":"纳米管/纳米线晶体管TEM检测与电学表征的相关性研究","authors":"Yann-Wen Lan, Po-Chun Chen","doi":"10.1007/978-981-13-2367-6_2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":331613,"journal":{"name":"Nanostructure Science and Technology","volume":"692 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Correlated Study of Nanotube/Nanowire Transistor Between TEM Inspection and Electrical Characterization\",\"authors\":\"Yann-Wen Lan, Po-Chun Chen\",\"doi\":\"10.1007/978-981-13-2367-6_2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":331613,\"journal\":{\"name\":\"Nanostructure Science and Technology\",\"volume\":\"692 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nanostructure Science and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-981-13-2367-6_2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanostructure Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-13-2367-6_2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}