{"title":"结构化流程流(spf):用于度量的流程模型","authors":"D. Tamanaha","doi":"10.1109/AERO.1991.154538","DOIUrl":null,"url":null,"abstract":"The author discusses an SPF process flow model that is suitable for communicating process descriptions to a wide audience and that can serve as a platform for metrics for both process and products. Large, complex, distributed command and control systems have been analyzed with a number of coordinated paradigms, including this model. Structured process flows give an integrated overview of systems complementary to the partitioned structure analysis models, as in structured analysis methods for real-time systems. They represent a leveled, end-to-end threaded view of the major processes in a system and provide the necessary first view of the system, while enabling the continuing decomposition for details. The SPFs are examined here as a platform for understanding processes, for exploration of metrics, and as a mechanism for collecting measurements.<<ETX>>","PeriodicalId":158617,"journal":{"name":"1991 IEEE Aerospace Applications Conference Digest","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Structured process flows (SPFs): a process model for metrics\",\"authors\":\"D. Tamanaha\",\"doi\":\"10.1109/AERO.1991.154538\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author discusses an SPF process flow model that is suitable for communicating process descriptions to a wide audience and that can serve as a platform for metrics for both process and products. Large, complex, distributed command and control systems have been analyzed with a number of coordinated paradigms, including this model. Structured process flows give an integrated overview of systems complementary to the partitioned structure analysis models, as in structured analysis methods for real-time systems. They represent a leveled, end-to-end threaded view of the major processes in a system and provide the necessary first view of the system, while enabling the continuing decomposition for details. The SPFs are examined here as a platform for understanding processes, for exploration of metrics, and as a mechanism for collecting measurements.<<ETX>>\",\"PeriodicalId\":158617,\"journal\":{\"name\":\"1991 IEEE Aerospace Applications Conference Digest\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-02-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991 IEEE Aerospace Applications Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AERO.1991.154538\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991 IEEE Aerospace Applications Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.1991.154538","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Structured process flows (SPFs): a process model for metrics
The author discusses an SPF process flow model that is suitable for communicating process descriptions to a wide audience and that can serve as a platform for metrics for both process and products. Large, complex, distributed command and control systems have been analyzed with a number of coordinated paradigms, including this model. Structured process flows give an integrated overview of systems complementary to the partitioned structure analysis models, as in structured analysis methods for real-time systems. They represent a leveled, end-to-end threaded view of the major processes in a system and provide the necessary first view of the system, while enabling the continuing decomposition for details. The SPFs are examined here as a platform for understanding processes, for exploration of metrics, and as a mechanism for collecting measurements.<>