利用CdSe制备纳米晶异质结器件及表征

C. Mehta
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引用次数: 0

摘要

本文描述了两种基于低成本CdSe纳米晶薄膜的异质结器件的合成、制造和分析。利用pva覆盖的n-CdSe薄膜在铝基板上创建了肖特基二极管,并使用化学浴沉积方法在铟镀膜玻璃基板上获得了CdSe/InSe/Al的二极管结构。衍射分析和透射电镜研究表明,沉积的薄膜具有纳米晶性质的混合锌结构。利用室温下的正偏置电流测量方法,研究了InSe/CdSe二极管在黑暗和照明条件下的响应。据此,计算了二极管的理想因数、内置电压、击穿电压、饱和电流和击穿电流。研究了Al/PVA:n- CdSe肖特基二极管在室温下的声学和电容电压特性。在反向偏置电压下,已经可以计算许多特性,包括载流子浓度、内置电压、势垒高度和耗尽层宽度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanocrystalline Heterojunction Device Fabrication and Characterization using CdSe
This article describes the synthesis, fabrication, and analysis of two heterojunction devices based on low-cost CdSe nanocrystalline thin films that have undergone solution processing. A schottky diode is created utilizing a PVA-capped n-CdSe thin film on an aluminium substrate, and a diode structure of CdSe/InSe/Al is obtained on indium coated glass substrates using the chemical bath deposition approach. Diffraction analysis and TEM studies reveal that the deposited thin films have a zinc mix structure that is nanocrystalline in nature. The response of InSe/CdSe diode has been investigated using forward bias current measurements at room temperature under dark and illumination conditions. Accordingly, ideality factor, built-in voltage, breakdown voltage, saturation current and breakdown current of the diode has been calculated. Acoustical and capacitance-voltage properties of Al/PVA:n- CdSe schottky diode has been studied at room temperature. Under reverse bias voltage, it has been possible to calculate a number of characteristics, including carrier concentration, built-in voltage, barrier height, and depletion layer width.
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