IEEE-1149.1用于德州仪器的验证和可测试性设计

Proceedings., Second Annual IEEE ASIC Seminar and Exhibit, Pub Date : 1989-09-25 DOI:10.1109/ASIC.1989.123190

A. Cron

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引用次数: 3

摘要

讨论了兼容JTAG/IEEE-1149.1扫描协议和标准的集成电路和系统测试调试的标准化和降低成本的产品。包括ASIC(专用集成电路)单元，标准接口IC，总线主IC，用于IBM兼容性的控制器接口板，高速扫描接口和控制扫描总线的软件。评估使用JTAG/IEEE-1149.1 ASIC标准时要考虑的权衡。

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IEEE-1149.1 use in design for verification and testability at Texas Instruments

Products aimed at standardization and cost reduction of IC and system test and debug, compatible with the JTAG/IEEE-1149.1 scan protocols and standards, are discussed. Included are ASIC (application-specific integrated circuit) cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Tradeoffs to be looked at when using the JTAG/IEEE-1149.1 standard for ASIC are evaluated.<>

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Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,

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