{"title":"成像强散射目标的采样策略新见解","authors":"U. Shahid, M. Fiddy","doi":"10.1109/SECON.2010.5453837","DOIUrl":null,"url":null,"abstract":"Recent advances in methods to invert data from strongly scattering targets has revealed the need to rethink how best to sample the scattered field. For strongly scattering targets, the inversion procedure is inherently nonlinear and we show that usual sampling procedures based on Shannon sampling concepts are inadequate and some prior knowledge of the maximum permittivity or refractive index of the target plays an important role.","PeriodicalId":286940,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","volume":"7 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New insights into sampling strategies for imaging strongly scattering targets\",\"authors\":\"U. Shahid, M. Fiddy\",\"doi\":\"10.1109/SECON.2010.5453837\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recent advances in methods to invert data from strongly scattering targets has revealed the need to rethink how best to sample the scattered field. For strongly scattering targets, the inversion procedure is inherently nonlinear and we show that usual sampling procedures based on Shannon sampling concepts are inadequate and some prior knowledge of the maximum permittivity or refractive index of the target plays an important role.\",\"PeriodicalId\":286940,\"journal\":{\"name\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"volume\":\"7 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.2010.5453837\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.2010.5453837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New insights into sampling strategies for imaging strongly scattering targets
Recent advances in methods to invert data from strongly scattering targets has revealed the need to rethink how best to sample the scattered field. For strongly scattering targets, the inversion procedure is inherently nonlinear and we show that usual sampling procedures based on Shannon sampling concepts are inadequate and some prior knowledge of the maximum permittivity or refractive index of the target plays an important role.
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