用于热管理应用的钼铜复合材料中的界面

M. Seiß, T. Mrotzek, U. Jäntsch, M. Klimenkov, J. Reiser, W. Knabl
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引用次数: 7

摘要

钼铜复合材料是氮化镓基电子器件热管理领域的热门材料。根据应用和包装要求,可以通过改变结构和成分来定制这些复合材料的热膨胀系数和导热系数。本文研究了钼与铜的界面。透射电镜显示钼层和铜层之间有明显的界面,没有扩散区。层间的低热接触电阻也表明钼和铜之间存在尖锐的界面。测量了电阻率,并与基于Wiedemann-Franz定律的估计值进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The interface in molybdenum-copper-composites used for thermal management applications
Molybdenum-copper-composites are interesting materials in the field of thermal management of gallium nitride based electronic devices. Depending on the application and packaging requirements, the coefficient of thermal expansion and thermal conductivity can be tailored for these composites by varying structure and composition. In this work, the interface between molybdenum and copper is studied. Transmission electron microscopy shows a sharp interface between the molybdenum and copper layers without interdiffusion zone. The low thermal contact resistance between the layers also suggests that there is sharp interface between molybdenum and copper. The electrical resistivity was measured and compared to estimations based on the Wiedemann-Franz law.
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