氧化Cu-Fe-Zn-P引线框架的表面分析

2019 International Conference on Electronics Packaging (ICEP) Pub Date : 2019-04-01 DOI:10.23919/ICEP.2019.8733471

Shi Chao, Jen-Hsiang Liu, Wei-Chen Huang, Jenn-Ming Song, Po-Yen Shen, Chi-Lin Huang, Lung-Tang Hung, Chin-Huang Chang

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引用次数: 0

摘要

本研究成功地建立了一种利用红外光谱和电化学还原分析表面氧化物的精确、高效的方法。对商品Cu-Fe-Zn-P (C194)引线框架表面氧化层的系统分析表明，该综合分析方法可用于确定上表面到下表面的氧化类型变化及相应的层厚。结果与XPS和TEM数据吻合较好。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Surface Analyses of Oxidized Cu-Fe-Zn-P Lead Frames

A precise and efficient method to analyze surface oxide using FTIR and electrochemical reduction was successfully developed in this study. Systematic analyses on surface oxide layer of commercial Cu-Fe-Zn-P (C194) lead frames demonstrate that this integrated analytical method can be applied to decide the variation in oxide type from top surface to subsurface and corresponding layer thickness. The results turned out to be in good agreement with XPS and TEM data.

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来源期刊

2019 International Conference on Electronics Packaging (ICEP)

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