人工埋W片GaAs的半绝缘性能

L. Wernersson, A. Litwin, L. Samuelson, W. Seifert
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引用次数: 0

摘要

在本文中,我们回顾了通过引入埋藏金属盘来控制半绝缘砷化镓形成的实验。通过外延过度生长将钨片基体嵌入到外延层中,研究了垂直于晶格的电流输运。圆盘对周围的砷化镓形成肖特基屏障,砷化镓被自由载流子耗尽。电导被证明在结构中以7个数量级的变化作为不同圆盘分离的函数。利用这种具有高圆盘密度的半绝缘结构,埋藏触点已通过光电导测量和空间电荷光谱进行了表征。实验结果与纳米肖特基势垒耗尽和充电的分析模型非常吻合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Semi-insulating properties of GaAs with artificially buried W discs
In this paper we review our experiments in which a controlled formation of semi-insulating GaAs by introduction of buried metal discs is demonstrated. A tungsten disc matrix is embedded in an epitaxial layer by epitaxial overgrowth and the current transport perpendicular to the lattice is studied. The discs form Schottky barriers to the surrounding GaAs, which is depleted from free carriers. The conductance is demonstrated to vary by 7 orders of magnitude in structures as a function of varying disc separation. Using such a semi-insulating structure with a high disc density, the buried contacts have been characterised by photo-conductivity measurements and space-charge spectroscopy. The experimental results are in excellent agreement with an analytical model for depletion and charging of nano-scale Schottky barriers.
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