基于时间序列模型的MOSFET剩余使用寿命预测方法

2021 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC) Pub Date : 2021-04-14 DOI:10.1109/IPEC51340.2021.9421316

Junkang Ni, C. Zhang, Xiaobin Zhang, T. Lei

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引用次数: 4

摘要

提出了一种基于时间序列模型的MOSFET剩余使用寿命预测方法。首先，从数学模型中获取MOSFET的退化数据。接下来，通过相关检验确定时间序列模型的差分阶数，利用Akaike信息准则(AIC)确定自相关模型和移动平均模型的阶数，从而确定时间序列模型的参数。然后加入短期周期预测，提高预测精度，减少累积误差。最后，利用Matlab/Simulink验证了所建立的寿命预测模型的有效性。

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Remaining Useful Life Prediction Method for MOSFET Based on Time Series Model

This paper presents a remaining useful life prediction method for MOSFET based on time series model. First, the degradation data of MOSFET is acquired from mathematical model. Next, correlation test is conducted to determine difference order of time-series model and Akaike information criterion (AIC) is used to determine the order of autocorrelation model and moving average model, thereby determining the parameters of time series model. Then, short-term cycle prediction is added to improve prediction accuracy and reduce accumulated error. Finally, the effectiveness of the developed life prediction model is verified using Matlab/Simulink.

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来源期刊

2021 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC)

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