一种用于提高集成电路成品率的统计工具的综述

Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium Pub Date : 1991-06-12 DOI:10.1109/UGIM.1991.148136

R. J. Joyce, R.D. Alderman, T. P. Djeu, J.C. Smith

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引用次数: 6

摘要

作者描述了哈里斯半导体公司开发的一个系统，用于分析电路故障和预测功能产量。该系统以关系数据库为基础，并结合应用统计工具。该系统的核心是使用市售INGRES软件的关系数据库。系统设计与支持软件和硬件工具一起进行审查，用于创建成品率分析工具箱。考虑到目前半导体制造的复杂程度，关系数据库的灵活性与正确的分析和统计工具相结合，为提高产量提供了一个强大的系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A review of a statistical tool set for the yield enhancement of integrated circuits

The authors describe a system that Harris Semiconductor has developed to aid in the analysis of circuit failures and predictions of functional yeilds. This system is based on a relational database in conjunction with the application of statistical tools. The core of the system is the relational database that uses the commercially available INGRES software. The system design is reviewed along with the supporting software and hardware tools used to create a tool box for yield analysis. Given the current levels of sophistication involved in manufacturing semiconductors, the flexibility of a relational database coupled with the correct analytical and statistical tools provides a powerful system for a yield enhancement resource.<>

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Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium

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