{"title":"采用多比特随机数据表示的统计信号参数测量的模块化结构","authors":"E. Petriu, A. Al-Dhaher, L. Zhao, M. Dostaler","doi":"10.1109/PACRIM.2001.953581","DOIUrl":null,"url":null,"abstract":"Generalizing von Neumans binary random-pulse machine concept, the paper discusses the multi-bit random-data representation and shows how it can be used for a modular instrumentation architecture for the measurement of first and second order statistical signal parameter measurements.","PeriodicalId":261724,"journal":{"name":"2001 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (IEEE Cat. No.01CH37233)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modular architecture for statistical signal parameter measurement using multi-bit random-data representation\",\"authors\":\"E. Petriu, A. Al-Dhaher, L. Zhao, M. Dostaler\",\"doi\":\"10.1109/PACRIM.2001.953581\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Generalizing von Neumans binary random-pulse machine concept, the paper discusses the multi-bit random-data representation and shows how it can be used for a modular instrumentation architecture for the measurement of first and second order statistical signal parameter measurements.\",\"PeriodicalId\":261724,\"journal\":{\"name\":\"2001 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (IEEE Cat. No.01CH37233)\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-08-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2001 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (IEEE Cat. No.01CH37233)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PACRIM.2001.953581\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (IEEE Cat. No.01CH37233)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PACRIM.2001.953581","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modular architecture for statistical signal parameter measurement using multi-bit random-data representation
Generalizing von Neumans binary random-pulse machine concept, the paper discusses the multi-bit random-data representation and shows how it can be used for a modular instrumentation architecture for the measurement of first and second order statistical signal parameter measurements.