cdznese厚多晶膜的表面形貌、结构性能及化学成分

2021 IEEE 2nd KhPI Week on Advanced Technology (KhPIWeek) Pub Date : 2021-09-13 DOI:10.1109/KhPIWeek53812.2021.9570098

Y. Znamenshchykov, M. Pashchenko, D. Kurbatov, O. Kononov, Yuriy Shkyrya, A. Opanasyuk

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引用次数: 2

摘要

采用近间隙真空升华法制备了厚的cdznese多晶薄膜。采用扫描电镜、x射线衍射、能谱分析等方法对其表面形貌、结构性能和化学成分进行了研究。该薄膜具有立方型的锌闪锌矿晶格和良好的晶体质量，表明其作为辐射探测器材料的研究前景良好。

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Surface morphology, structural properties and chemical composition of CdZnTeSe thick polycrystalline films

Thick polycrystalline CdZnTeSe films were deposited by close-spaced vacuum sublimation method. The surface morphology, structural properties and chemical composition were studied by scanning electron microscopy, X-ray diffraction, energy dispersive spectroscopy. The films have cubic zinc-blende crystal lattice and fairly good crystalline quality, which suggest good perspective of their investigation as a material for radiation detectors.

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2021 IEEE 2nd KhPI Week on Advanced Technology (KhPIWeek)

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