多F可逆一维QCA阵列的测试

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI:10.1109/DFT.2007.17

Jing Huang, Xiaojun Ma, C. Metra, F. Lombardi

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引用次数: 2

摘要

可逆逻辑设计是数字计算中一个众所周知的范例。本文研究了量子点元胞自动机(QCA)在阵列系统中可逆逻辑的可测试实现。研究了多单元故障下ID阵列的c可测试性。已有研究表明，在存在多个故障的情况下，故障屏蔽是可能的[9]。介绍了一种通过增加可控性和可观察性行来实现ID阵列c -可测性的技术。提出了可控性和可观测性的线路选择规则。给出了使用[9]中提出的QCA可逆逻辑门的示例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Testing Reversible One-Dimensional QCA Arrays for Multiple F

Reversible logic design is a well-known paradigm in digital computation. In this paper, quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic in array systems. C-testability of a ID array is investigated for multiple cell faults. It has been shown that fault masking is possible in the presence of multiple faults [9]. A technique for achieving C-testability of ID array is introduced by adding lines for controllability and observability. Rules for choosing lines for controllability and observability are proposed. Examples using the QCA reversible logic gates proposed in [9] are presented.

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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)

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