{"title":"近场毫米波矢量显微镜的实验与建模","authors":"T. Auriac, J. Raoult","doi":"10.1109/PIERS59004.2023.10221305","DOIUrl":null,"url":null,"abstract":"Near field vector measurement are used from optics to microwaves to identify and image materials and devices on the surface or buried under a thin layer of material. We developed a model of near field interaction between a dipole and a substrate based on our experimental setup of near field millimeter wave vector microscopy. A comparison between the model and the measurement results is presented and discussed.","PeriodicalId":354610,"journal":{"name":"2023 Photonics & Electromagnetics Research Symposium (PIERS)","volume":"179 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experiments and Modeling of a Near-Field Millimeter Wave Vector Microscope\",\"authors\":\"T. Auriac, J. Raoult\",\"doi\":\"10.1109/PIERS59004.2023.10221305\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Near field vector measurement are used from optics to microwaves to identify and image materials and devices on the surface or buried under a thin layer of material. We developed a model of near field interaction between a dipole and a substrate based on our experimental setup of near field millimeter wave vector microscopy. A comparison between the model and the measurement results is presented and discussed.\",\"PeriodicalId\":354610,\"journal\":{\"name\":\"2023 Photonics & Electromagnetics Research Symposium (PIERS)\",\"volume\":\"179 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 Photonics & Electromagnetics Research Symposium (PIERS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PIERS59004.2023.10221305\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 Photonics & Electromagnetics Research Symposium (PIERS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PIERS59004.2023.10221305","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experiments and Modeling of a Near-Field Millimeter Wave Vector Microscope
Near field vector measurement are used from optics to microwaves to identify and image materials and devices on the surface or buried under a thin layer of material. We developed a model of near field interaction between a dipole and a substrate based on our experimental setup of near field millimeter wave vector microscopy. A comparison between the model and the measurement results is presented and discussed.