{"title":"容错电路和概率检验证明","authors":"A. Gál, M. Szegedy","doi":"10.1109/SCT.1995.514728","DOIUrl":null,"url":null,"abstract":"We introduce a new model of fault tolerance for Boolean circuits. We consider synchronized circuits and we allow an adversary to choose a small constant fraction of the gates at each level of the circuit to be faulty. We require that even in the presence of such faults the circuit compute a \"loose version\" of the given function. We show that every symmetric function has a small (size O(n), depth O(log n)) fault tolerant circuit in this model. We also show a perhaps unexpected relation between our model and probabilistically checkable proofs.","PeriodicalId":318382,"journal":{"name":"Proceedings of Structure in Complexity Theory. Tenth Annual IEEE Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Fault tolerant circuits and probabilistically checkable proofs\",\"authors\":\"A. Gál, M. Szegedy\",\"doi\":\"10.1109/SCT.1995.514728\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We introduce a new model of fault tolerance for Boolean circuits. We consider synchronized circuits and we allow an adversary to choose a small constant fraction of the gates at each level of the circuit to be faulty. We require that even in the presence of such faults the circuit compute a \\\"loose version\\\" of the given function. We show that every symmetric function has a small (size O(n), depth O(log n)) fault tolerant circuit in this model. We also show a perhaps unexpected relation between our model and probabilistically checkable proofs.\",\"PeriodicalId\":318382,\"journal\":{\"name\":\"Proceedings of Structure in Complexity Theory. Tenth Annual IEEE Conference\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Structure in Complexity Theory. Tenth Annual IEEE Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SCT.1995.514728\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Structure in Complexity Theory. Tenth Annual IEEE Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SCT.1995.514728","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault tolerant circuits and probabilistically checkable proofs
We introduce a new model of fault tolerance for Boolean circuits. We consider synchronized circuits and we allow an adversary to choose a small constant fraction of the gates at each level of the circuit to be faulty. We require that even in the presence of such faults the circuit compute a "loose version" of the given function. We show that every symmetric function has a small (size O(n), depth O(log n)) fault tolerant circuit in this model. We also show a perhaps unexpected relation between our model and probabilistically checkable proofs.