P. Janus, R. Dobrowolski, A. Sierakowski, F. Ivaldi, D. Szmigiel, J. Zajac
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Soft dielectric cantilevers with silicon tips for atomic force microscopy applications
In this paper authors present design, technology and application of soft silicon dioxide AFM cantilevers. Novel technology allows for manufacturing ultra-soft cantilevers equipped with silicon tip. Mechanical properties of developed probes were tested and finally applied in AFM measurements of fragile samples.