J. Castagnola, P. Petrashin, Agustin Laprovitta, W. Lancioni
{"title":"基于N-MOST振荡器的总辐照剂量测量","authors":"J. Castagnola, P. Petrashin, Agustin Laprovitta, W. Lancioni","doi":"10.1109/urucon53396.2021.9647052","DOIUrl":null,"url":null,"abstract":"This work presents a novel methodology for measuring gamma radiation doses, based on an OBIST (Oscillation-Based Built In Self-Testing) scheme. The studied circuit has a configuration of a Colpitts oscillator designed with three nMOS transistors. The gamma radiation incidence on the transistors produces a shift in the threshold voltage, which changes the oscillation frequency and makes it possible to measure the value of the radiation dose.","PeriodicalId":337257,"journal":{"name":"2021 IEEE URUCON","volume":"136 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Total Irradiated Dose Measurement Using N-MOST Based Oscillator\",\"authors\":\"J. Castagnola, P. Petrashin, Agustin Laprovitta, W. Lancioni\",\"doi\":\"10.1109/urucon53396.2021.9647052\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a novel methodology for measuring gamma radiation doses, based on an OBIST (Oscillation-Based Built In Self-Testing) scheme. The studied circuit has a configuration of a Colpitts oscillator designed with three nMOS transistors. The gamma radiation incidence on the transistors produces a shift in the threshold voltage, which changes the oscillation frequency and makes it possible to measure the value of the radiation dose.\",\"PeriodicalId\":337257,\"journal\":{\"name\":\"2021 IEEE URUCON\",\"volume\":\"136 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE URUCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/urucon53396.2021.9647052\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE URUCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/urucon53396.2021.9647052","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Total Irradiated Dose Measurement Using N-MOST Based Oscillator
This work presents a novel methodology for measuring gamma radiation doses, based on an OBIST (Oscillation-Based Built In Self-Testing) scheme. The studied circuit has a configuration of a Colpitts oscillator designed with three nMOS transistors. The gamma radiation incidence on the transistors produces a shift in the threshold voltage, which changes the oscillation frequency and makes it possible to measure the value of the radiation dose.