基于SiC mosfet的双有源桥式变换器软开关过程的理论和实验分析

T. Lagier, P. Ladoux
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引用次数: 7

摘要

在新的电网中,串联/并联变换器架构可以考虑用于中高压电源转换。双有源桥(DAB)拓扑结构是在这些转换器中实现的一个重要候选。为了提高功率密度,以更高的开关频率工作是趋势。由于零电压开关(ZVS)操作,DAB拓扑允许降低开关损耗。理论上,ZVS的工作范围只取决于变换器的工作范围。实际上,由于寄生元件参与了软开关过程,ZVS的工作范围可能会被修改。本文对基于SiC MOSFET的DAB变换器的软开关过程进行了分析。本研究基于对1.2 kV−100 kW DC-DC变换器样机的分析分析和实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theoretical and experimental analysis of the soft switching process for SiC MOSFETs based Dual Active Bridge converters
In the new electrical grids, series/parallel converters architectures can be considered for medium and high voltage power conversion. Dual Active Bridge (DAB) topology is a serious candidate to be implemented within these converters. In order to increase the power density, the trend is to operate with a higher switching frequency. Thanks to Zero Voltage Switching (ZVS) operation, DAB topology allows the switching losses to be reduced. Theoretically, the ZVS operation range depends only on the operating range of the converter. In reality, since the parasitic elements are involved in the soft switching process, the ZVS operation range may be modified. In this paper, the authors propose an analysis of the soft switching process for the case of a SiC MOSFET based DAB converter. This study is based on analytical analysis and experimental results obtained with a 1.2 kV −100 kW DC-DC converter prototype.
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