{"title":"一种有效的测试应用算法","authors":"Z. Zijian, Chen Junliang","doi":"10.1109/CICCAS.1991.184444","DOIUrl":null,"url":null,"abstract":"DTS (dynamic test sequence) algorithm the simplification and extension of adaptive experiment, is developed as an engineering approach for locating faults more efficiently at PCB functional testing level. The application in a practical ATE system is presented in detail. Comparison with the arbitrary test application shows its advantages.<<ETX>>","PeriodicalId":119051,"journal":{"name":"China., 1991 International Conference on Circuits and Systems","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An effective algorithm for test application\",\"authors\":\"Z. Zijian, Chen Junliang\",\"doi\":\"10.1109/CICCAS.1991.184444\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"DTS (dynamic test sequence) algorithm the simplification and extension of adaptive experiment, is developed as an engineering approach for locating faults more efficiently at PCB functional testing level. The application in a practical ATE system is presented in detail. Comparison with the arbitrary test application shows its advantages.<<ETX>>\",\"PeriodicalId\":119051,\"journal\":{\"name\":\"China., 1991 International Conference on Circuits and Systems\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"China., 1991 International Conference on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICCAS.1991.184444\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"China., 1991 International Conference on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICCAS.1991.184444","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
DTS (dynamic test sequence) algorithm the simplification and extension of adaptive experiment, is developed as an engineering approach for locating faults more efficiently at PCB functional testing level. The application in a practical ATE system is presented in detail. Comparison with the arbitrary test application shows its advantages.<>
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