DeepPerform:一种有效的资源约束神经网络性能测试方法

Simin Chen, Mirazul Haque, Cong Liu, Wei Yang
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引用次数: 9

摘要

如今,越来越多的自适应深度神经网络(adnn)被用于资源受限的嵌入式设备。我们观察到,与传统软件类似,adnn中存在冗余计算,导致相当大的性能下降。性能下降取决于输入,被称为输入相关性能瓶颈(IDPBs)。为了确保AdNN满足资源受限应用程序的性能需求,必须进行性能测试以检测AdNN中的idpb。现有的神经网络测试方法主要关注正确性测试,而不涉及性能测试。为了填补这一空白,我们提出了DeepPerform,一种可扩展的方法来生成测试样本来检测adnn中的IDPBs。我们首先演示了如何将生成检测idpb的性能测试样本的问题表述为优化问题。接下来,我们演示了DeepPerform如何通过学习和估计adnn的计算消耗分布来有效地处理优化问题。我们在三个广泛使用的数据集上对五种流行的AdNN模型进行了评估。结果表明,DeepPerform生成的测试样本会导致更严重的性能下降(FLOPs:增加高达552%)。此外,DeepPerform在生成测试输入方面比基线方法更有效(运行时开销:只有6-10毫秒)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DeepPerform: An Efficient Approach for Performance Testing of Resource-Constrained Neural Networks
Today, an increasing number of Adaptive Deep Neural Networks (AdNNs) are being used on resource-constrained embedded devices. We observe that, similar to traditional software, redundant computation exists in AdNNs, resulting in considerable performance degradation. The performance degradation is dependent on the input and is referred to as input-dependent performance bottlenecks (IDPBs). To ensure an AdNN satisfies the performance requirements of resource-constrained applications, it is essential to conduct performance testing to detect IDPBs in the AdNN. Existing neural network testing methods are primarily concerned with correctness testing, which does not involve performance testing. To fill this gap, we propose DeepPerform, a scalable approach to generate test samples to detect the IDPBs in AdNNs. We first demonstrate how the problem of generating performance test samples detecting IDPBs can be formulated as an optimization problem. Following that, we demonstrate how DeepPerform efficiently handles the optimization problem by learning and estimating the distribution of AdNNs’ computational consumption. We evaluate DeepPerform on three widely used datasets against five popular AdNN models. The results show that DeepPerform generates test samples that cause more severe performance degradation (FLOPs: increase up to 552%). Furthermore, DeepPerform is substantially more efficient than the baseline methods in generating test inputs (runtime overhead: only 6–10 milliseconds).
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