基于大数据和人工智能技术的半导体制造过程化学监测与预测系统

Hyung-Min Cho, Kyung-Hee Lee, Peter Shim, A. Park
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引用次数: 0

摘要

半导体制造过程中使用大量化学物质,表面处理的均匀性和质量控制是通过对过程中化学物质的精确控制来实现的。每个工艺的可重复性和再现性是晶圆厂最关心的问题,即使是稍微偏离规格也会导致昂贵的设备污染和晶圆废料。在本研究中,我们提出了一个实时大数据分析系统,该系统集成并管理工厂多个点的被测物质状态,并对其进行实时监控,当超过预设的上限/下限时,向管理人员发送报警信息。此外,我们提出了一种人工智能预测模型,该模型通过使用积累的数据作为学习数据集来预测物质的状态。数据分析监测系统和AI预测模型旨在通过未来对相关数据集的额外学习,不断提高准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Chemical Monitoring and Prediction System in Semiconductor Manufacturing Process Using Bigdata and AI Techniques
Numerous chemical substances are used in the semiconductor manufacturing process, and homogeneity and quality control of surface treatment are performed through precise control of chemical substances in the process. The repeatability and reproducibility of each process is a fab’s greatest concern, and even a slight deviation from specifications can lead to expensive equipment contamination and wafer scrap. In this study, we propose a real-time big data analysis system that integrates and manages the state of substances being measured at numerous points in a factory, and monitors them in real time, and delivers an alarm message to the manager when the preset upper/lower limit is exceeded. In addition, we propose an artificial intelligence prediction model that predicts the state of matter by using accumulated data as learning datasets. The data analysis and monitoring system and AI prediction model are designed to continuously improve accuracy through additional learning of related datasets in the future.
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