{"title":"基于大数据和人工智能技术的半导体制造过程化学监测与预测系统","authors":"Hyung-Min Cho, Kyung-Hee Lee, Peter Shim, A. Park","doi":"10.1109/ICAIIC51459.2021.9415241","DOIUrl":null,"url":null,"abstract":"Numerous chemical substances are used in the semiconductor manufacturing process, and homogeneity and quality control of surface treatment are performed through precise control of chemical substances in the process. The repeatability and reproducibility of each process is a fab’s greatest concern, and even a slight deviation from specifications can lead to expensive equipment contamination and wafer scrap. In this study, we propose a real-time big data analysis system that integrates and manages the state of substances being measured at numerous points in a factory, and monitors them in real time, and delivers an alarm message to the manager when the preset upper/lower limit is exceeded. In addition, we propose an artificial intelligence prediction model that predicts the state of matter by using accumulated data as learning datasets. The data analysis and monitoring system and AI prediction model are designed to continuously improve accuracy through additional learning of related datasets in the future.","PeriodicalId":432977,"journal":{"name":"2021 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Chemical Monitoring and Prediction System in Semiconductor Manufacturing Process Using Bigdata and AI Techniques\",\"authors\":\"Hyung-Min Cho, Kyung-Hee Lee, Peter Shim, A. Park\",\"doi\":\"10.1109/ICAIIC51459.2021.9415241\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Numerous chemical substances are used in the semiconductor manufacturing process, and homogeneity and quality control of surface treatment are performed through precise control of chemical substances in the process. The repeatability and reproducibility of each process is a fab’s greatest concern, and even a slight deviation from specifications can lead to expensive equipment contamination and wafer scrap. In this study, we propose a real-time big data analysis system that integrates and manages the state of substances being measured at numerous points in a factory, and monitors them in real time, and delivers an alarm message to the manager when the preset upper/lower limit is exceeded. In addition, we propose an artificial intelligence prediction model that predicts the state of matter by using accumulated data as learning datasets. The data analysis and monitoring system and AI prediction model are designed to continuously improve accuracy through additional learning of related datasets in the future.\",\"PeriodicalId\":432977,\"journal\":{\"name\":\"2021 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-04-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICAIIC51459.2021.9415241\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICAIIC51459.2021.9415241","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Chemical Monitoring and Prediction System in Semiconductor Manufacturing Process Using Bigdata and AI Techniques
Numerous chemical substances are used in the semiconductor manufacturing process, and homogeneity and quality control of surface treatment are performed through precise control of chemical substances in the process. The repeatability and reproducibility of each process is a fab’s greatest concern, and even a slight deviation from specifications can lead to expensive equipment contamination and wafer scrap. In this study, we propose a real-time big data analysis system that integrates and manages the state of substances being measured at numerous points in a factory, and monitors them in real time, and delivers an alarm message to the manager when the preset upper/lower limit is exceeded. In addition, we propose an artificial intelligence prediction model that predicts the state of matter by using accumulated data as learning datasets. The data analysis and monitoring system and AI prediction model are designed to continuously improve accuracy through additional learning of related datasets in the future.