用能量色散x射线荧光测定计算机磁盘上多元素涂层的厚度和组成

Workshop on Optical Fabrication and Testing Pub Date : 1900-01-01 DOI:10.1364/oft.1984.thdb2

B. Wheeler, C. Thomas, D. Gedcke, A. Welco

{"title":"用能量色散x射线荧光测定计算机磁盘上多元素涂层的厚度和组成","authors":"B. Wheeler, C. Thomas, D. Gedcke, A. Welco","doi":"10.1364/oft.1984.thdb2","DOIUrl":null,"url":null,"abstract":"Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determination of Thickness and Composition of Multielement Coatings on Computer Disks Using Energy Dispersive X-Ray Fluorescence\",\"authors\":\"B. Wheeler, C. Thomas, D. Gedcke, A. Welco\",\"doi\":\"10.1364/oft.1984.thdb2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.\",\"PeriodicalId\":170034,\"journal\":{\"name\":\"Workshop on Optical Fabrication and Testing\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Workshop on Optical Fabrication and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/oft.1984.thdb2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1984.thdb2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

用于计算机工业的多元件涂覆磁盘的制造通常要求衬底合金上的镀或涂覆材料的位置和厚度的公差非常接近。由于这些类型的材料对可见光谱是不透明的，因此最方便和可靠的测定方法是x射线荧光的非破坏性技术。

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Determination of Thickness and Composition of Multielement Coatings on Computer Disks Using Energy Dispersive X-Ray Fluorescence

Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.

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Workshop on Optical Fabrication and Testing

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