Quo Vadis信号?用于晶体管级可编程结构编程后验证的自动方向性提取

Apurva Jain, T. Broadfoot, Y. Makris, C. Sechen
{"title":"Quo Vadis信号?用于晶体管级可编程结构编程后验证的自动方向性提取","authors":"Apurva Jain, T. Broadfoot, Y. Makris, C. Sechen","doi":"10.23919/DATE56975.2023.10136928","DOIUrl":null,"url":null,"abstract":"We discuss the challenges related with developing a post-programming verification solution for a TRAnsistor-level Programmable fabric (TRAP). Toward achieving high density, the TRAP architecture employs bidirectionally-operated pass transis-tors in the implementation of its logic and interconnect network. While it is possible to model such transistors through appropriate primitives of hardware description languages (HDL) to enable simulation-based validation, Logic Equivalence Checking (LEC) methods and tools do not support such primitives. As a result, formally verifying the functionality programmed by a given bit-stream on TRAP is not innately possible. To address this limitation, we introduce a method for automatically determining the signal flow direction through bidirectional pass transistors for a given bit-stream and subsequently converting the HDL describing the programmed fabric to consist only of unidirectional transistors. Thereby, commercial EDA tools can be used to check logic equivalence between the transistor-level HDL describing the programmed fabric and the post-synthesis gate-level netlist.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Quo Vadis Signal? Automated Directionality Extraction for Post-Programming Verification of a Transistor-Level Programmable Fabric\",\"authors\":\"Apurva Jain, T. Broadfoot, Y. Makris, C. Sechen\",\"doi\":\"10.23919/DATE56975.2023.10136928\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We discuss the challenges related with developing a post-programming verification solution for a TRAnsistor-level Programmable fabric (TRAP). Toward achieving high density, the TRAP architecture employs bidirectionally-operated pass transis-tors in the implementation of its logic and interconnect network. While it is possible to model such transistors through appropriate primitives of hardware description languages (HDL) to enable simulation-based validation, Logic Equivalence Checking (LEC) methods and tools do not support such primitives. As a result, formally verifying the functionality programmed by a given bit-stream on TRAP is not innately possible. To address this limitation, we introduce a method for automatically determining the signal flow direction through bidirectional pass transistors for a given bit-stream and subsequently converting the HDL describing the programmed fabric to consist only of unidirectional transistors. Thereby, commercial EDA tools can be used to check logic equivalence between the transistor-level HDL describing the programmed fabric and the post-synthesis gate-level netlist.\",\"PeriodicalId\":340349,\"journal\":{\"name\":\"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/DATE56975.2023.10136928\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/DATE56975.2023.10136928","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

我们讨论了与开发晶体管级可编程结构(TRAP)的编程后验证解决方案相关的挑战。为了实现高密度,TRAP架构在其逻辑和互连网络的实现中采用双向操作的通路晶体管。虽然可以通过硬件描述语言(HDL)的适当原语来建模这样的晶体管,以实现基于仿真的验证,但逻辑等效检查(LEC)方法和工具不支持这样的原语。因此,在TRAP上正式验证由给定的位流编程的功能是不可能的。为了解决这一限制,我们引入了一种方法,该方法可以通过给定比特流的双向通流晶体管自动确定信号流方向,然后将描述编程结构的HDL转换为仅由单向晶体管组成。因此,商用EDA工具可用于检查描述编程结构的晶体管级HDL与合成后的门级网表之间的逻辑等效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quo Vadis Signal? Automated Directionality Extraction for Post-Programming Verification of a Transistor-Level Programmable Fabric
We discuss the challenges related with developing a post-programming verification solution for a TRAnsistor-level Programmable fabric (TRAP). Toward achieving high density, the TRAP architecture employs bidirectionally-operated pass transis-tors in the implementation of its logic and interconnect network. While it is possible to model such transistors through appropriate primitives of hardware description languages (HDL) to enable simulation-based validation, Logic Equivalence Checking (LEC) methods and tools do not support such primitives. As a result, formally verifying the functionality programmed by a given bit-stream on TRAP is not innately possible. To address this limitation, we introduce a method for automatically determining the signal flow direction through bidirectional pass transistors for a given bit-stream and subsequently converting the HDL describing the programmed fabric to consist only of unidirectional transistors. Thereby, commercial EDA tools can be used to check logic equivalence between the transistor-level HDL describing the programmed fabric and the post-synthesis gate-level netlist.
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