ku波段双spdt RF-MEMS开关的研制

D. Yamane, Winston Sun, H. Fujita, H. Toshiyoshi, S. Kawasaki
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引用次数: 9

摘要

本文介绍了用于双spdt开关系统的低损耗欧姆接触RF-MEMS双侧驱动开关的设计、制造方法和测量结果。该开关是基于硅体微加工技术和分层技术在SOI晶圆上制造的。我们展示了与电镀和高纵横比Deep-RIE工艺的兼容性,以具有无损的准空气悬浮MEMS波导和足够厚的金层用于侧壁欧姆接触。典型性能为插入损耗0.56 dB,回波损耗19.4 dB,隔离度51.4 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of a Dual-SPDT RF-MEMS switch for Ku-band
This paper presents the design, fabrication method and measurement results on a low-loss Ohmic-contact RF-MEMS switch with a bi-lateral actuation for a Dual-SPDT switching system. The switch was fabricated based on the silicon bulk-micromachining technology and a layer-wise technique on an SOI wafer. We demonstrated a compatibility with electroplating and high aspect-ratio Deep-RIE process to have loss-less quasi-air-suspended MEMS waveguides and adequately thick gold layer for side-wall ohmic contact. Typical performance shows 0.56 dB insertion loss, 19.4 dB return loss and 51.4 dB isolation at the Ku-band frequency of 12 GHz.
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