一种有效的签名加载机制，用于内存修复

Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI:10.1109/EWDTS.2014.7027061

V. Sargsyan

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引用次数: 0

摘要

内建自测试(BIST)和内建自修复(BISR)已广泛用于嵌入式存储器的测试和修复。这些电路的缺点之一是记忆修复信号的传递过程通常被称为硬修复流。本文引入了一种内存修复签名加载机制，大大减少了内存修复组织时间。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An efficient signature loading mechanism for memory repair

Built-in Self-Test (BIST) and Built-In Self-Repair (BISR) have been widely used for embedded memories test and repair purposes. One of the disadvantages of these circuits is the memory repair signature delivery process at what is typically known as hard repair flow. In this paper, a memory repair signature loading mechanism is introduced, which significantly reduces memory repair organization time.

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Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)

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