小深度量子电路的量子性测试

Shuichi Hirahara, Franccois Le Gall
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引用次数: 12

摘要

最近,Brakerski, Christiano, Mahadev, Vazirani和Vidick (FOCS 2018)展示了如何基于带误差学习(LWE)假设构建量子性测试:在LWE假设下,量子计算机可以有效地解决该测试,但经典多项式时间计算机无法解决该测试。该测试导致了几个加密应用程序。特别是,它已被应用于从单个不受信任的量子设备产生可认证的随机性,单个量子设备的自我测试以及与设备无关的量子密钥分发。在本文中,我们证明了这种量子测试,以及基本上所有上述应用,实际上可以通过一类非常弱的量子电路来实现:结合对数深度经典计算的恒定深度量子电路。这揭示了这个量子基本测试的新的复杂性理论性质,并为小深度量子电路优于经典计算提供了新的具体证据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Test of Quantumness with Small-Depth Quantum Circuits
Recently Brakerski, Christiano, Mahadev, Vazirani and Vidick (FOCS 2018) have shown how to construct a test of quantumness based on the learning with errors (LWE) assumption: a test that can be solved efficiently by a quantum computer but cannot be solved by a classical polynomial-time computer under the LWE assumption. This test has lead to several cryptographic applications. In particular, it has been applied to producing certifiable randomness from a single untrusted quantum device, self-testing a single quantum device and device-independent quantum key distribution. In this paper, we show that this test of quantumness, and essentially all the above applications, can actually be implemented by a very weak class of quantum circuits: constant-depth quantum circuits combined with logarithmic-depth classical computation. This reveals novel complexity-theoretic properties of this fundamental test of quantumness and gives new concrete evidence of the superiority of small-depth quantum circuits over classical computation.
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