强化:数字设计的分析前硅侧通道特性

A. V. Lakshmy, C. Rebeiro, S. Bhunia
{"title":"强化:数字设计的分析前硅侧通道特性","authors":"A. V. Lakshmy, C. Rebeiro, S. Bhunia","doi":"10.1109/ASP-DAC52403.2022.9712551","DOIUrl":null,"url":null,"abstract":"Power side-channel attacks are potent security threats that exploit the power consumption patterns of an electronic device to glean sensitive information ranging from secret keys and passwords to web-browsing activity. While pre-Silicon tools promise early detection of side-channel leakage at the design stage, they require several hours of simulation time. In this paper, we present an analytical framework called FORTIFY that estimates the power side-channel vulnerability of digital circuit designs at signal-level granularity, given the RTL or gate-level netlist of the design, at least 100 times faster than contemporary works. We demonstrate the correctness of FORTIFY by comparing it with a recent simulation-based side-channel leakage analysis framework. We also test its scalability by evaluating FORTIFY on an open-source System-on-Chip.","PeriodicalId":239260,"journal":{"name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"FORTIFY: Analytical Pre-Silicon Side-Channel Characterization of Digital Designs\",\"authors\":\"A. V. Lakshmy, C. Rebeiro, S. Bhunia\",\"doi\":\"10.1109/ASP-DAC52403.2022.9712551\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power side-channel attacks are potent security threats that exploit the power consumption patterns of an electronic device to glean sensitive information ranging from secret keys and passwords to web-browsing activity. While pre-Silicon tools promise early detection of side-channel leakage at the design stage, they require several hours of simulation time. In this paper, we present an analytical framework called FORTIFY that estimates the power side-channel vulnerability of digital circuit designs at signal-level granularity, given the RTL or gate-level netlist of the design, at least 100 times faster than contemporary works. We demonstrate the correctness of FORTIFY by comparing it with a recent simulation-based side-channel leakage analysis framework. We also test its scalability by evaluating FORTIFY on an open-source System-on-Chip.\",\"PeriodicalId\":239260,\"journal\":{\"name\":\"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASP-DAC52403.2022.9712551\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASP-DAC52403.2022.9712551","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

功率侧信道攻击是一种强大的安全威胁,它利用电子设备的功耗模式来收集从密钥和密码到网络浏览活动的敏感信息。虽然pre-Silicon工具承诺在设计阶段早期检测侧通道泄漏,但它们需要几个小时的模拟时间。在本文中,我们提出了一个名为FORTIFY的分析框架,该框架在给定设计的RTL或门级网络列表的情况下,以信号级粒度估计数字电路设计的功率侧信道脆弱性,其速度至少比当代作品快100倍。我们通过将其与最近基于仿真的侧通道泄漏分析框架进行比较来证明FORTIFY的正确性。我们还通过在开源的片上系统上评估FORTIFY来测试其可伸缩性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
FORTIFY: Analytical Pre-Silicon Side-Channel Characterization of Digital Designs
Power side-channel attacks are potent security threats that exploit the power consumption patterns of an electronic device to glean sensitive information ranging from secret keys and passwords to web-browsing activity. While pre-Silicon tools promise early detection of side-channel leakage at the design stage, they require several hours of simulation time. In this paper, we present an analytical framework called FORTIFY that estimates the power side-channel vulnerability of digital circuit designs at signal-level granularity, given the RTL or gate-level netlist of the design, at least 100 times faster than contemporary works. We demonstrate the correctness of FORTIFY by comparing it with a recent simulation-based side-channel leakage analysis framework. We also test its scalability by evaluating FORTIFY on an open-source System-on-Chip.
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