{"title":"BNM/LCIE和BIPM之间10 V约瑟夫森阵列电压标准的比较","authors":"J. Lo-Hive, D. Reymann, G. Genevès","doi":"10.1109/CPEM.1994.333439","DOIUrl":null,"url":null,"abstract":"An indirect comparison between the 10 V Josephson array voltage standards of the BNM/LCIE and the BIPM has been carried out using Zener-diode based voltage references as transfer standards. The results show an agreement of 5 parts in 10/sup 9/ with an uncertainty (1/spl sigma/) of 3 parts in 10/sup 9/, mainly due to instability of the Zener references. A direct comparison is to be carried out early in 1994 to avoid this limitation.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Comparisons of 10 V Josephson array voltage standards between the BNM/LCIE and the BIPM\",\"authors\":\"J. Lo-Hive, D. Reymann, G. Genevès\",\"doi\":\"10.1109/CPEM.1994.333439\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An indirect comparison between the 10 V Josephson array voltage standards of the BNM/LCIE and the BIPM has been carried out using Zener-diode based voltage references as transfer standards. The results show an agreement of 5 parts in 10/sup 9/ with an uncertainty (1/spl sigma/) of 3 parts in 10/sup 9/, mainly due to instability of the Zener references. A direct comparison is to be carried out early in 1994 to avoid this limitation.<<ETX>>\",\"PeriodicalId\":388647,\"journal\":{\"name\":\"Proceedings of Conference on Precision Electromagnetic Measurements Digest\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Conference on Precision Electromagnetic Measurements Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1994.333439\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1994.333439","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparisons of 10 V Josephson array voltage standards between the BNM/LCIE and the BIPM
An indirect comparison between the 10 V Josephson array voltage standards of the BNM/LCIE and the BIPM has been carried out using Zener-diode based voltage references as transfer standards. The results show an agreement of 5 parts in 10/sup 9/ with an uncertainty (1/spl sigma/) of 3 parts in 10/sup 9/, mainly due to instability of the Zener references. A direct comparison is to be carried out early in 1994 to avoid this limitation.<>