M. Regis, O. Llopis, L. Escotte, R. Plana, A. Gruhle, T. Brazil, M. Chaubet, J. Graffeuil
{"title":"SiGe HBT的非线性建模及其在超低相位噪声介质谐振振荡器中的应用","authors":"M. Regis, O. Llopis, L. Escotte, R. Plana, A. Gruhle, T. Brazil, M. Chaubet, J. Graffeuil","doi":"10.1109/MWSYM.1999.779430","DOIUrl":null,"url":null,"abstract":"We propose a large signal model for a packaged SiGe heterojunction bipolar transistor. Pulsed I-V measurements are used to avoid thermal effects. The current model yields excellent correlation with pulsed output characteristics and S-parameters up to 18 GHz. The model's validity is established by designing ultra low phase noise C and X band dielectric resonator oscillators (DROs).","PeriodicalId":339267,"journal":{"name":"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Nonlinear modeling of a SiGe HBT with applications to ultra low phase noise dielectric resonator oscillators\",\"authors\":\"M. Regis, O. Llopis, L. Escotte, R. Plana, A. Gruhle, T. Brazil, M. Chaubet, J. Graffeuil\",\"doi\":\"10.1109/MWSYM.1999.779430\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a large signal model for a packaged SiGe heterojunction bipolar transistor. Pulsed I-V measurements are used to avoid thermal effects. The current model yields excellent correlation with pulsed output characteristics and S-parameters up to 18 GHz. The model's validity is established by designing ultra low phase noise C and X band dielectric resonator oscillators (DROs).\",\"PeriodicalId\":339267,\"journal\":{\"name\":\"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1999.779430\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1999.779430","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nonlinear modeling of a SiGe HBT with applications to ultra low phase noise dielectric resonator oscillators
We propose a large signal model for a packaged SiGe heterojunction bipolar transistor. Pulsed I-V measurements are used to avoid thermal effects. The current model yields excellent correlation with pulsed output characteristics and S-parameters up to 18 GHz. The model's validity is established by designing ultra low phase noise C and X band dielectric resonator oscillators (DROs).