微芯片可编程限流电源开关LX7712的总电离剂量特性

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745721

M. Sureau, M. Leuenberger, N. Rezzak, D. Johnson

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引用次数: 0

摘要

给出了Microchip辐照硬化可编程限流电源开关IC LX7712的总电离剂量(TID)表征结果。经100krad(Si) TID处理后性能良好，与辐照前数据相当。仅在某些参数上观察到一些变化，但是这些变化都不会对系统级性能产生重大影响。

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Total Ionizing Dose Characterization of Microchip Programmable Current Limiting Power Switch LX7712

The total ionizing dose (TID) characterization results of the Microchip radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The performance after 100krad(Si) TID is determined to be good and comparable to pre-irradiation data. Some shifts were observed on some parameters only, however, none of these will impact materially the system-level performance.

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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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