利用光子技术的二维电场扫描仪

2002 International Topical Meeting on Microwave Photonics Pub Date : 1900-01-01 DOI:10.1109/MWP.2002.1158865

A. Sasaki, T. Nagatsuma

{"title":"利用光子技术的二维电场扫描仪","authors":"A. Sasaki, T. Nagatsuma","doi":"10.1109/MWP.2002.1158865","DOIUrl":null,"url":null,"abstract":"A novel electric-field scanner (E-Scan) allows us to obtain two-dimensional electric-field images in a short time by scanning with a laser beam. Measurement time with E-Scan is decreased by more than one order compared to previous electric-field mapping systems. We have demonstrated measurement of antenna radiation patterns and millimeter-wave imaging with E-Scan.","PeriodicalId":176293,"journal":{"name":"2002 International Topical Meeting on Microwave Photonics","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Two-dimensional electric-field scanner using photonic techniques\",\"authors\":\"A. Sasaki, T. Nagatsuma\",\"doi\":\"10.1109/MWP.2002.1158865\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel electric-field scanner (E-Scan) allows us to obtain two-dimensional electric-field images in a short time by scanning with a laser beam. Measurement time with E-Scan is decreased by more than one order compared to previous electric-field mapping systems. We have demonstrated measurement of antenna radiation patterns and millimeter-wave imaging with E-Scan.\",\"PeriodicalId\":176293,\"journal\":{\"name\":\"2002 International Topical Meeting on Microwave Photonics\",\"volume\":\"127 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 International Topical Meeting on Microwave Photonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWP.2002.1158865\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 International Topical Meeting on Microwave Photonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.2002.1158865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

一种新型的电场扫描器(E-Scan)使我们能够在短时间内通过激光束扫描获得二维电场图像。与以前的电场测绘系统相比，E-Scan的测量时间减少了一个数量级以上。我们已经演示了用E-Scan测量天线辐射方向图和毫米波成像。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Two-dimensional electric-field scanner using photonic techniques

A novel electric-field scanner (E-Scan) allows us to obtain two-dimensional electric-field images in a short time by scanning with a laser beam. Measurement time with E-Scan is decreased by more than one order compared to previous electric-field mapping systems. We have demonstrated measurement of antenna radiation patterns and millimeter-wave imaging with E-Scan.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2002 International Topical Meeting on Microwave Photonics

自引率

0.00%

发文量