利用超出扩散极限的随机介质中的散斑统计

Chen Bar, Marina Alterman, Ioannis Gkioulekas, Anat Levin
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引用次数: 0

摘要

利用一种新的MC模拟器,研究了散射介质中散斑场的统计特性。这允许理解记忆效应的限制,并使用散斑相关性来提高我们通过随机介质看到的能力
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Exploiting speckle statistics in random media beyond the diffusion limit
Using a new MC simulator, we study statistics of speckle fields in scattering media. This allows understanding the Memory Effect limits and using speckle correlations to improve our ability to see through random media
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