用双光束点衍射干涉仪检测精密光学元件表面形状

N. Voznesenskiy, Mariia Voznesenskaia, Lei Huang, M. Idir
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引用次数: 0

摘要

描述了用双光束点衍射干涉仪(PDI) D7对x射线反射镜的测试。得益于两个独立的测试光束和参考光束,使用D7加上附属光学元件的镜面测量变得简单可靠。从而简化了系统误差去除和拼接子孔径测量的过程。本文介绍了实现子孔径波前拼接高精度的主要技术,并对所述仪器进行了进一步的展望。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testing surface form of precision optics by a point diffraction interferometer with two beams
Testing of an X-ray mirror by a point diffraction interferometer (PDI) D7 with two beams is described. Thanks to the two independent test and reference beams, mirrors metrology using the D7 coupled with accessory optics becomes straightforward and reliable. Therefore procedure of systematic error removal and sub-aperture measurements with stitching are simplified. In this paper, we describe the main technique to achieve high accuracy of stitching sub-aperture wavefronts, followed by further perspectives of the described instrument.
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