用于电磁成像和材料表征的微波和毫米波传感器、系统和技术

International Journal of Microwave Science and Technology Pub Date : 2012-11-20 DOI:10.1155/2012/132136

A. Randazzo, K. Donnell, Y. Lee

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引用次数: 3

摘要

1热那亚大学海军、电气、电子和电信工程系应用电磁学组，意大利热那亚16145;2密苏里科技大学电气与计算机工程系应用微波无损检测实验室(amntl)，美国密苏里州罗拉65409;3安立公司质检部，美国加利福尼亚州摩根希尔95037

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Microwave and Millimeter-Wave Sensors, Systems, and Techniques for Electromagnetic Imaging and Materials Characterization

1Applied Electromagnetics Group, Department of Naval, Electrical, Electronic, and Telecommunication Engineering, University of Genoa, 16145 Genoa, Italy 2Applied Microwave Nondestructive Testing Laboratory (amntl), Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO 65409, USA 3Department of Quality, Anritsu Company, Morgan Hill, CA 95037, USA

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International Journal of Microwave Science and Technology

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