{"title":"SID4波前传感器定量相位成像的超表面表征","authors":"V. Genuer, R. Laberdesque, B. Wattellier","doi":"10.1364/FIO.2020.FW5F.1","DOIUrl":null,"url":null,"abstract":"Quantitative phase imaging (QPI) solutions are developed to characterize metasurfaces in single-shot. SID4 wavefront sensor based on Quadriwave Lateral Shearing Interferometry (QWLSI), is used to provide the quantitative phase information such as wavefront, PSF, MTF.","PeriodicalId":193476,"journal":{"name":"High Contrast Metastructures X","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Metasurfaces characterization by quantitative phase imaging with SID4 wavefront sensor\",\"authors\":\"V. Genuer, R. Laberdesque, B. Wattellier\",\"doi\":\"10.1364/FIO.2020.FW5F.1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantitative phase imaging (QPI) solutions are developed to characterize metasurfaces in single-shot. SID4 wavefront sensor based on Quadriwave Lateral Shearing Interferometry (QWLSI), is used to provide the quantitative phase information such as wavefront, PSF, MTF.\",\"PeriodicalId\":193476,\"journal\":{\"name\":\"High Contrast Metastructures X\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"High Contrast Metastructures X\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/FIO.2020.FW5F.1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"High Contrast Metastructures X","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/FIO.2020.FW5F.1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Metasurfaces characterization by quantitative phase imaging with SID4 wavefront sensor
Quantitative phase imaging (QPI) solutions are developed to characterize metasurfaces in single-shot. SID4 wavefront sensor based on Quadriwave Lateral Shearing Interferometry (QWLSI), is used to provide the quantitative phase information such as wavefront, PSF, MTF.
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