{"title":"极高阻抗测量的校准/验证标准","authors":"M. Haase, K. Hoffmann","doi":"10.1109/ARFTG.2015.7381474","DOIUrl":null,"url":null,"abstract":"The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Calibration/verification standards for measurement of extremely high impedances\",\"authors\":\"M. Haase, K. Hoffmann\",\"doi\":\"10.1109/ARFTG.2015.7381474\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).\",\"PeriodicalId\":170825,\"journal\":{\"name\":\"2015 86th ARFTG Microwave Measurement Conference\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 86th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2015.7381474\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 86th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2015.7381474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Calibration/verification standards for measurement of extremely high impedances
The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
