基于sram的FPGA辐射防护实时冗余擦洗系统

Jianwei Zhang, Tao Han, Yajun Li, Jinghu Li
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引用次数: 3

摘要

基于sram的现场可编程门阵列(FPGA)在空间环境中容易受到以单事件扰动(SEU)效应为代表的严重辐射效应的影响。三模冗余(Triple Modular Redundancy, TMR)和组态擦洗是FPGA防辐射的有效方法,但各有缺点:TMR结构不能纠错,擦洗电路对辐射敏感,又称“擦洗器”。针对这一问题,本文提出了一种实时冗余擦洗(RRS)系统。在传统构型洗涤的基础上,将TMR结构应用于洗涤器。并在传统的TMR结构中加入误差指标。当洗涤器由于SEU产生误差时,将对洗涤器进行实时洗涤,防止误差累积。另外,三个冗余逻辑的平面布置图是分布式的,避免了一个SEU同时对多个冗余逻辑的影响。本文采用随机故障注入的方法对RRS系统的抗辐射能力进行了评价。试验结果表明,RRS系统的抗辐射能力比传统构型洗涤系统提高2倍以上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Real-Time Redundant Scrubbing (RRS) System for Radiation Protection on SRAM-Based FPGA
SRAM-based Field Programmable Gate Array (FPGA) is vulnerable to the serious radiation effects represented by Single Event Upset (SEU) effect in space. Triple Modular Redundancy (TMR) and configuration scrubbing are effective methods of FPGA radiation protection, but each has its own shortcomings: TMR structure can’t correct errors, and scrub circuit, also called “scrubber”, is sensitive to radiation. In response to the problem, this paper proposes a Real-time Redundant Scrubbing (RRS) system. Based on the traditional configuration scrubbing, TMR structure is applied to the scrubber. And the error indicator is added to the traditional TMR structure. When the scrubber has errors due to SEU, the scrubber will be scrubbed in real-time to prevent error accumulation. In addition, the floorplan of the three redundant logic is distributed to avoid the influence of a SEU on multiple redundant logic at the same time. In this paper, the anti-radiation capability of the proposed RRS system is evaluated by random fault injection. The test results show that the anti-radiation capability of the RRS system is more than 2 times higher than that of traditional configuration scrubbing system.
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