{"title":"利用快速二维经验模态分解和数学形态学进行边缘检测","authors":"James Z. Zhang, Zijing Qin","doi":"10.1109/SECON.2010.5453903","DOIUrl":null,"url":null,"abstract":"This article presents an edge detection method using fast Bidimensional EMD and mathematical morphological methods. It is shown that the detection results are better than other comparable algorithms. The optimization of the presented algorithm extracts sufficient features for intended applications.","PeriodicalId":286940,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","volume":"23 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Edge detection using fast Bidimensional Empirical Mode Decomposition and mathematical morphology\",\"authors\":\"James Z. Zhang, Zijing Qin\",\"doi\":\"10.1109/SECON.2010.5453903\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents an edge detection method using fast Bidimensional EMD and mathematical morphological methods. It is shown that the detection results are better than other comparable algorithms. The optimization of the presented algorithm extracts sufficient features for intended applications.\",\"PeriodicalId\":286940,\"journal\":{\"name\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"volume\":\"23 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.2010.5453903\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.2010.5453903","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Edge detection using fast Bidimensional Empirical Mode Decomposition and mathematical morphology
This article presents an edge detection method using fast Bidimensional EMD and mathematical morphological methods. It is shown that the detection results are better than other comparable algorithms. The optimization of the presented algorithm extracts sufficient features for intended applications.
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