{"title":"考虑失效机理依赖的电子产品可靠性建模方法","authors":"Ying Chen, C. Ye, Xiaoqin Zhang, R. Kang, Dan Xue","doi":"10.1109/CYBER.2014.6917500","DOIUrl":null,"url":null,"abstract":"There are varieties of failure mechanisms in electronic product, and they show a very strong dependence between each other. Understanding and describing the dependence of failure mechanism is the basis for product reliability prediction and assessment based on physics of failure. Starting from the characteristic of failure mechanism, this paper studies the classification of failure mechanism correlations, derives the mathematical model of reliability of each single failure mechanism correlation, and studies system reliability modeling method of electronic product considering failure mechanisms dependence based on reliability block diagram. Taking a voltage protection module as example, failure correlation between different components and dependence between mechanisms in one component are both discussed, their reliability models are built, and reliability parameters of the voltage protection module are obtained eventually.","PeriodicalId":183401,"journal":{"name":"The 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Reliability modeling method of electronic products considering failure mechanism dependence\",\"authors\":\"Ying Chen, C. Ye, Xiaoqin Zhang, R. Kang, Dan Xue\",\"doi\":\"10.1109/CYBER.2014.6917500\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"There are varieties of failure mechanisms in electronic product, and they show a very strong dependence between each other. Understanding and describing the dependence of failure mechanism is the basis for product reliability prediction and assessment based on physics of failure. Starting from the characteristic of failure mechanism, this paper studies the classification of failure mechanism correlations, derives the mathematical model of reliability of each single failure mechanism correlation, and studies system reliability modeling method of electronic product considering failure mechanisms dependence based on reliability block diagram. Taking a voltage protection module as example, failure correlation between different components and dependence between mechanisms in one component are both discussed, their reliability models are built, and reliability parameters of the voltage protection module are obtained eventually.\",\"PeriodicalId\":183401,\"journal\":{\"name\":\"The 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CYBER.2014.6917500\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CYBER.2014.6917500","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability modeling method of electronic products considering failure mechanism dependence
There are varieties of failure mechanisms in electronic product, and they show a very strong dependence between each other. Understanding and describing the dependence of failure mechanism is the basis for product reliability prediction and assessment based on physics of failure. Starting from the characteristic of failure mechanism, this paper studies the classification of failure mechanism correlations, derives the mathematical model of reliability of each single failure mechanism correlation, and studies system reliability modeling method of electronic product considering failure mechanisms dependence based on reliability block diagram. Taking a voltage protection module as example, failure correlation between different components and dependence between mechanisms in one component are both discussed, their reliability models are built, and reliability parameters of the voltage protection module are obtained eventually.