硅技术中的太赫兹显微镜

R. Al Hadi, Y. Zhao, J. Hwang, M. Chang
{"title":"硅技术中的太赫兹显微镜","authors":"R. Al Hadi, Y. Zhao, J. Hwang, M. Chang","doi":"10.1109/IMBIoC47321.2020.9385018","DOIUrl":null,"url":null,"abstract":"This paper presents a terahertz microscope offering sub-wavelength resolution for imaging applications. The chip consists of a coupled terahertz Colpitts oscillators operating at 550GHz. It is implemented in a standard CMOS 65nm technology. A near-field sensing region between the oscillators is sensitive to external perturbation and results in a shift of the operating frequency. The far-field radiating frequency is extracted by an on-chip antenna and measured with an external harmonic mixer. The spatial resolution is verified with a micro-positioning stage.","PeriodicalId":297049,"journal":{"name":"2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Terahertz Microscopy in Silicon Technology\",\"authors\":\"R. Al Hadi, Y. Zhao, J. Hwang, M. Chang\",\"doi\":\"10.1109/IMBIoC47321.2020.9385018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a terahertz microscope offering sub-wavelength resolution for imaging applications. The chip consists of a coupled terahertz Colpitts oscillators operating at 550GHz. It is implemented in a standard CMOS 65nm technology. A near-field sensing region between the oscillators is sensitive to external perturbation and results in a shift of the operating frequency. The far-field radiating frequency is extracted by an on-chip antenna and measured with an external harmonic mixer. The spatial resolution is verified with a micro-positioning stage.\",\"PeriodicalId\":297049,\"journal\":{\"name\":\"2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMBIoC47321.2020.9385018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMBIoC47321.2020.9385018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了一种太赫兹显微镜,为成像应用提供亚波长分辨率。该芯片由一个耦合的太赫兹科尔皮茨振荡器组成,工作频率为550GHz。它采用标准的CMOS 65纳米技术实现。振荡器之间的近场感应区域对外部扰动很敏感,导致工作频率的偏移。远场辐射频率由片上天线提取,外加谐波混频器测量。利用微定位平台验证了空间分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Terahertz Microscopy in Silicon Technology
This paper presents a terahertz microscope offering sub-wavelength resolution for imaging applications. The chip consists of a coupled terahertz Colpitts oscillators operating at 550GHz. It is implemented in a standard CMOS 65nm technology. A near-field sensing region between the oscillators is sensitive to external perturbation and results in a shift of the operating frequency. The far-field radiating frequency is extracted by an on-chip antenna and measured with an external harmonic mixer. The spatial resolution is verified with a micro-positioning stage.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信