{"title":"混响室集成电路的辐射抗扰度试验","authors":"Reinhart Heinrich, R. Bechly, B. Deutschmann","doi":"10.1109/EMCEUROPE.2012.6396877","DOIUrl":null,"url":null,"abstract":"Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Radiated immunity testing of integrated circuits in reverberation chambers\",\"authors\":\"Reinhart Heinrich, R. Bechly, B. Deutschmann\",\"doi\":\"10.1109/EMCEUROPE.2012.6396877\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.\",\"PeriodicalId\":377100,\"journal\":{\"name\":\"International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2012.6396877\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2012.6396877","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Radiated immunity testing of integrated circuits in reverberation chambers
Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
